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The atomic geometry of Si(100)-(2×1) revisitedHOLLAND, B. W; DUKE, C. B; PATON, A et al.Surface science. 1984, Vol 140, Num 2, pp L269-L278, issn 0039-6028Article

New results on the quenched 1×1 structure of Si{111} surfacesYANG, W. S; JONA, F.Physical review. B, Condensed matter. 1983, Vol 28, Num 2, pp 1178-1180, issn 0163-1829Article

ON THE EWALD SUMMATION TECHNIQUE FOR 2D LATTICESSOLBRIG H.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 72; NO 1; PP. 199-205; ABS. GER; BIBL. 14 REF.Article

A CONICAL FIVE-ELEMENT ELECTRON GUN FOR LEED EXPERIMENTSCOWELL PG.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 10; PP. 994-996; BIBL. 4 REF.Article

SOME OBSERVATIONS ON THE USE OF RELIABILITY INDICES IN LEED CRYSTALLOGRAPHYHENGRASMEE S; MITCHELL KAR; WATSON PR et al.1980; CAN. J. PHYS.; ISSN 0008-4204; CAN; DA. 1980; VOL. 58; NO 2; PP. 200-206; ABS. FRE; BIBL. 32 REF.Article

Surface-barrier structure of Cu(001) from analysis of low-energy electron diffraction = Structure de barrière de surface de Cu(001) à partir de l'analyse de diffraction d'électrons lentsREAD, M. N.Physical review. B, Condensed matter. 1985, Vol 32, Num 4, pp 2677-2680, issn 0163-1829Article

Effective calculation of LEED intensities using symmetry-adapted functionsMORITZ, W.Journal of physics. C. Solid state physics. 1984, Vol 17, Num 2, pp 353-362, issn 0022-3719Article

Determination of the incidence and azimuth angles in LEED experimentsMROZ, S; GRUNDNIEWSKI, A; BAK, E et al.Journal of physics. E. Scientific instruments. 1983, Vol 16, Num 9, pp 858-861, issn 0022-3735Article

Atomic structure of a {001} surface of Ni₃Al = Structure atomique d'une surface {001} de Ni₃AlSONDERICKER, D; JONA, F; MARCUS, P. M et al.Physical review. B, Condensed matter. 1986, Vol 33, Num 2, pp 900-903, issn 0163-1829Article

Spin polarized low energy electron diffraction (SPLEED)STACHULEC, K.Physica, B + C. 1986, Vol 142, Num 3, pp 332-347, issn 0378-4363Article

A mirror electron microscope for surface analysisFOSTER, M. S; CAMPUZANO, J. C; WILLIS, R. F et al.Journal of microscopy (Print). 1985, Vol 140, Num 3, pp 395-403, issn 0022-2720Article

Structure analysis of Si(111) 2×1 with low-energy electron diffractionHIMPSEL, F. J; MARCUS, P. M; TROMP, R et al.Physical review. B, Condensed matter. 1984, Vol 30, Num 4, pp 2257-2259, issn 0163-1829Article

Dynamical analysis of low-energy electron diffraction intensities from Al on GaP(110): the high-coverage AlP(110) limitDUKE, C. B; PATON, A; KAHN, A et al.Physical review. B, Condensed matter. 1983, Vol 28, Num 2, pp 852-859, issn 0163-1829Article

Electron diffraction on steps and kinks on a crystal surface = Diffraction électronique sur les marches et les liens sur une surface cristallineBURKOV, S. E.Solid state communications. 1985, Vol 56, Num 4, pp 355-358, issn 0038-1098Article

General aspects of beam threshold effects in leedGAUBERT, C; BAUDOING, R; GAUTHIER, Y et al.Surface science. 1984, Vol 147, Num 1, pp 162-178, issn 0039-6028Article

Sensitivity analysis of surface structure determination by low energy electron diffractionOLSZEWSKI, G. B; BERNASEK, S. L.The Journal of chemical physics. 1983, Vol 79, Num 7, pp 3581-3589, issn 0021-9606Article

A novel procedure for fast surface structural analysis based on LEED intensity dataKLEINLE, G; MORITZ, W; ADAMS, D. L et al.Surface science. 1989, Vol 219, Num 3, pp L637-L645, issn 0039-6028Article

Theory of LEED in crystals with defectsLITZMAN, O; DUB, P.Journal of physics. C. Solid state physics. 1987, Vol 20, Num 33, pp 5449-5458, issn 0022-3719Article

Multilayer relaxation for the clean Ni(110) surface = Relaxation multicouche pour la surface Ni (110) propreXU, M. L; TONG, S. Y.Physical review. B, Condensed matter. 1985, Vol 31, Num 10, pp 6332-6336, issn 0163-1829Article

Interlayer multiple diffraction in LEEDKOHLER, H; HEINZ, K.Surface science. 1984, Vol 136, Num 2-3, pp 345-360, issn 0039-6028Article

Single-scattering cluster calculations and Fourier-transform analyses of normal photoelectron diffractionORDERS, P. J; FADLEY, C. S.Physical review. B, Condensed matter. 1983, Vol 27, Num 2, pp 781-798, issn 0163-1829Article

Test of structural models for the Si (111)2×1 surfaceLIU, H; COOK, M. R; JONA, F et al.Physical review. B, Condensed matter. 1983, Vol 28, Num 10, pp 6137-6140, issn 0163-1829Article

ETUDE DE L'AUTODIFFUSION SUPERFICIELLE D'APRES LA VARIATION DU PROFIL D'INTENSITE D'UNE REFLEXION DANS LA DIFFRACTION D'ELECTRONS LENTSSHKLYAEV AA; REPINSKIJ SM.1980; FIZ. TEKH. PROVODN.; SUN; DA. 1980; VOL. 14; NO 7; PP. 1300-1305; BIBL. 18 REF.Article

HIGH-RESOLUTION STUDY OF LOW-ELECTRON-DIFFRACTION THRESHOLD EFFECTS ON W(001) SURFACES.ADNOT A; CARETTE JD.1977; PHYS. REV. LETTERS; U.S.A.; DA. 1977; VOL. 38; NO 19; PP. 1084-1087; BIBL. 17 REF.Article